ICOS Vision Systems PVI-6

01 April 2009 | ICOS Vision Systems
Nominations: Best technology for silicon feedstock and wafer processes

DESCRIPTION

The PVI-6 consists of a family of inspection modules designed for the inspection of solar cells throughout the production process, from bare wafer, to silicon nitride (SiN) coating, metallization and final classification. Additionally, the PVI-6 software includes improved ease of use and analytical tools to increase the overall yield of the solar cell production process.

INNOVATIVE ASPECT

PVI-6 offers solar wafer and cell manufacturers the following key features:

  • Higher accuracy and repeatability measurements, with up to a 4x measurement accuracy improvement, delivers higher yield and improved end-of-line cell classification
  • Easier calibration and set-up, with calibration time decreased by approximately 80 percent, enables faster product ramp during initial installation
  • Tool matching and central module management offers consistent and easily attainable results in large production environments, across multiple production lines

BENEFITS

These new capabilities (above) enable solar manufacturers to achieve substantial yield improvements and more accurate product classification. The revenue from a given solar cell production line can be improved using the new inspection modules by eliminating "overkill" errors in cell classification at the end of the line. Errors in classification of cells have an immediate impact on the price for which a cell can be sold. We have done studies showing that up to 2%, and even more, of cells have been misclassified [to a lower class] -- cells that should have been classified in the top-rated class. ICOS’s studies found that overkill can be reduced by more accurate inspection, with attendant savings of up to $1M/year in additional revenue per production line.

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